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    • Hipps, K.W.
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    • Mechanical and Materials Engineering, School of
    • Faculty - Mechanical and Materials Engineering
    • Hipps, K.W.
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    Hipps, K. W. (13)
    Mazur, Ursula (4)Crosby, G. A. (2)Dickinson, J.T. (2)Francis, A. H. (2)Fried, G.A. (2)Ermer, D. R. (1)Fried, Dale (1)Jahanbekam, Abdolreza (1)Jensen, L.C. (1)... View MoreDate Issued2010 - 2014 (2)1990 - 1999 (4)1980 - 1989 (3)1976 - 1979 (4)

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    Magnetically Induced Circular Polarization of Emission: Application to Inorganic Complexes 

    Hipps, K. W.; Crosby, G. A. (1978)
    A sensitive spectrometer for the measurement of circular polarization of emission, utilizing a photoelastic modulator, is presented. This spectrometer, when augmented by a superconducting magnet and dewar assembly, provides ...
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    A Scanning Tunneling Microscope with a Wide Sampling Range 

    Hipps, K. W.; Fried, G.A.; Fried, Dale (1990)
    Construction of a simple scanning tunneling microscope (STM) is described. This STM is suitable for atmospheric, controlled atmosphere, and high vacuum (but not UHV) work. This STM is especially wen suited for determining ...
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    Phonon Scattering Times in a Molecular Crystal Below 10K Determined by Optically Detected Acoustic Paramagnetic Resonance 

    Hipps, K. W.; Francis, A. H. (1978)
    A combination of optically detected magnetic and acoustical paramagnetic resonance has been used to determine the phonon scattering time of microwave-frequency phonons in a molecular crystal in the 2- to 7-K temperature ...
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    An All Digital Inelastic Electron Tunneling Spectrometer Utilizing the IEEE-488 Instrument Bus and an IBM PC-XT Controller 

    Hipps, K. W. (1987)
    An easily assembled computer‐controlled tunneling spectrometer is described. Spectral acquisition time is user selectable over a wide range. Low‐resolution spectra may be taken rapidly (about 30s/scan) or very slow scans ...
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    Constant Resolution Tunneling Spectroscopy 

    Hipps, K. W.; Mazur, Ursula (1988)
    An inelastic electron tunneling spectrometer is described which is capable of providing constantresolution spectra over the 0 to greater than 16 OOO-cm --I range. Constant-resolution data acquisition is especially beneficial ...
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    Interaction of wide band gap single crystals with 248 nm excimer laser radiation. IV. Positive ion emission from MgO and NaNO3 

    Ermer, D. R.; Shin, J.-J.; Langford, S. C.; Hipps, K. W.; Dickinson, J.T. (1996)
    We report quadrupole mass-selected, time-of-flight measurements of Mg1 from polished, single crystal MgO and Na1 from cleaved, single crystal NaNO3 exposed to 248 nm ~5 eV!laser radiation. A large fraction of the ions emitted ...
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    Charge transfer induced chemical reaction of tetracyano- p-quinodimethane adsorbed on graphene 

    Qi, Yun; Mazur, Ursula; Hipps, K. W. (2012)
    Raman spectroscopy was used to study the interaction of 7,7,8,8-tetracyano-p-quinodimethane (TCNQ) deposited on graphene films grown by Chemical Vapor Deposition (CVD). Different thickness layers (1 ML to 7 ML) of TCNQ ...
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    The Use of Scanning Conduction Microscopy to Probe Abrasion of Insulating Films 

    Dickinson, J.T.; Jensen, L.C.; Siek, K.H.; Hipps, K. W. (1995)
    The scanning force microscope (SFM) is a useful tool for examining the consequences of tribological wear, particularly on inherently flat surfaces such as single crystals. How- ever, on moderately rough surfaces, changes ...
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    The Construction and Application of a Novel Glove-Box Deposition System to the Study of Air-Sensitive Materials by Tunneling Spectroscopy 

    Mazur, Ursula; Hipps, K. W. (1984)
    The construction and application of a high-vacuum deposition system housed in a recirculating, catalytically scrubbed, inert-atmosphere glove box is reported. This system is specifically applied to the fabrication of tunnel ...
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    A New Variable Temperature Solution-Solid Interface Scanning Tunneling Microscope 

    Jahanbekam, Abdolreza; Mazur, Ursula; Hipps, K. W. (2014)
    Scanning tunneling microscopy (STM) has been widely used to investigate surface structures and electronic properties of adsorbed species on surfaces and also for observing chemical reactions on surfaces. The technique can ...
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