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A Scanning Tunneling Microscope with a Wide Sampling Range

Hipps, K. W.; Fried, G.A.; Fried, Dale (1990)

Construction of a simple scanning tunneling microscope (STM) is described. This STM is suitable for atmospheric, controlled atmosphere, and high vacuum (but not UHV) work. This STM is especially wen suited for determining ...

Interaction of wide band gap single crystals with 248 nm excimer laser radiation. IV. Positive ion emission from MgO and NaNO3

Ermer, D. R.; Shin, J.-J.; Langford, S. C.; Hipps, K. W.; Dickinson, J.T. (1996)

We report quadrupole mass-selected, time-of-ﬂight measurements of Mg1 from polished, single crystal MgO and Na1 from cleaved, single crystal NaNO3 exposed to 248 nm ~5 eV!laser radiation. A large fraction of the ions emitted ...

The Use of Scanning Conduction Microscopy to Probe Abrasion of Insulating Films

Dickinson, J.T.; Jensen, L.C.; Siek, K.H.; Hipps, K. W. (1995)

The scanning force microscope (SFM) is a useful tool for examining the consequences of tribological wear, particularly on inherently flat surfaces such as single crystals. How- ever, on moderately rough surfaces, changes ...

Gold Coated Tungsten Tips for Scanning Tunneling Microscopy

Fried, G.A.; Wang, X.D.; Hipps, K. W. (1993)

Electrochemically etched tungsten scanning tunneling microscope (STM) tips are dc sputter coated with 20 nm of gold (0.04 rim/s and 10 mTorr of argon). Transmission electron microscope (TEM) images of typical etched tips ...