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CHARACTERIZATION OF SECONDARY PHASES IN Cd0.9Zn0.1Te DETECTOR GRADE SEMICONDUCTOR BY IR TRANSMISSION MICROSCOPE AND IMPLEMENTATION OF AMPOULE ROTATION TECHNIQUE IN MODIFIED VERTICAL BRIDGMAN GROWTH TO MINIMIZE THE SECONDARY PHASES
(2013)
Presence of secondary phases (precipitates/inclusions) in cadmium zinc telluride (CZT) crystals degrades the performance of the materials as radiation detectors. The infrared (IR) transmission microscope was used to quantify ...